The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 24, 2025

Filed:

May. 14, 2021
Applicant:

Orbital Insight, Inc., Palo Alto, CA (US);

Inventors:

Shasvat Mukeshkumar Desai, Cambridge, MA (US);

Kaushik Patnaik, Cupertino, CA (US);

Assignee:

ORBITAL INSIGHT, INC., PALO ALTO, US;

Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 18/243 (2023.01); G06F 18/21 (2023.01); G06F 18/214 (2023.01); G06F 18/2413 (2023.01); G06N 5/04 (2023.01); G06N 20/00 (2019.01); G06T 7/60 (2017.01); G06V 10/40 (2022.01); G06V 20/13 (2022.01);
U.S. Cl.
CPC ...
G06V 20/13 (2022.01); G06F 18/2148 (2023.01); G06F 18/2178 (2023.01); G06F 18/2413 (2023.01); G06F 18/24317 (2023.01); G06N 5/04 (2013.01); G06N 20/00 (2019.01); G06T 7/60 (2013.01); G06V 10/40 (2022.01); G06T 2207/10032 (2013.01); G06V 2201/08 (2022.01);
Abstract

A system and method are disclosed for determining a classification and sub-classification of an aircraft. The system receives an aerial image of a geographic area that includes one or more aircrafts. The system inputs the aerial image into a machine learning model. The system receives an output from the machine learning model for each aircraft of the one or more aircrafts. Based on the output for each aircraft, the system determines a set of geometric measurements. The system compares the set of geometric measurements to a plurality of known sets of geometric measurements. Based on the comparison, the system identifies a known set of geometric measurements from the plurality of known sets of geometric measurements. The known set is mapped by a database to a sub-classification. The system outputs the sub-classification.


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