Katuhiko Suzuki

Title: Innovations by Katuhiko Suzuki

Introduction

Katuhiko Suzuki is a notable inventor based in Ohra-gun, Japan. He has made significant contributions to the field of semiconductor testing, holding two patents that enhance the efficiency of integrated circuit (IC) testing processes. His work is recognized for its innovative approaches to reducing waiting times and improving measurement accuracy.

Latest Patents

Suzuki's latest patents include a semiconductor device tester and an IC testing method. The semiconductor device tester patent describes an IC tester that eliminates useless waiting times by utilizing a simultaneous measurement mode. This mode allows the handler to wait for test preparations to complete in both test stations before transmitting signals to the tester part. The IC testing method patent outlines a process where ICs are arranged in an m-row, n-column array on a test tray, allowing for efficient testing by connecting them to corresponding sockets. This method ensures that all ICs are tested simultaneously, significantly improving testing efficiency.

Career Highlights

Katuhiko Suzuki is currently employed at Adv Antest Corporation, where he continues to develop innovative solutions for semiconductor testing. His work has contributed to advancements in the industry, making testing processes faster and more reliable.

Collaborations

Suzuki collaborates with talented coworkers, including Takeshi Onishi and Hidetaka Nakazawa, who contribute to the innovative environment at Adv Antest Corporation.

Conclusion

Katuhiko Suzuki's contributions to semiconductor testing through his patents demonstrate his commitment to innovation and efficiency in the field. His work continues to influence the industry positively, paving the way for future advancements.