The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 01, 2001
Filed:
Dec. 15, 1998
Takeshi Onishi, Gyoda, JP;
Katuhiko Suzuki, Ohra-gun, JP;
Advantest Corporation, Tokyo, JP;
Abstract
In an IC tester comprising a tester part and a handler which includes two test stations or an IC tester comprising a tester part and two handlers, useless waiting times wasted by the tester part are eliminated. Means (SO) is provided for inputting a simultaneous measurement mode into the handler,, and when the simultaneous measurement mode is inputted, the handler waits, in case the test preparation in the first test station,is completed and the test preparation in the second test station,is not completed, till the test preparation in the second station is completed, and when the test preparation in the second station is completed, the handler transmits the test preparation complete signals of both the stations to the tester part,. The handler waits, in case the test preparation in the second station is completed and the test preparation in the first station is not completed, till the test preparation in the first station is completed, and when the test preparation in the first station is completed, the handler transmits the test preparation complete signals of both the stations to the tester part.