Kasugai, Japan

Katsuhito Kojima

This inventor holds 1 USPTO granted patent. Top assignee: Fujitsu Semiconductor Limited. Active years: 2013.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Katsuhito Kojima. Retrieved from https://idiyas.com/inventor/katsuhito-kojima

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2013

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1 patent (USPTO):Explore Patents

Title: Innovations of Katsuhito Kojima

Introduction

Katsuhito Kojima is a notable inventor based in Kasugai, Japan. He has made significant contributions to the field of semiconductor technology. His work primarily focuses on methods for generating reticle data, which is crucial in the manufacturing of semiconductor devices.

Latest Patents

Kojima holds a patent for a "Method and apparatus for generating reticle data." This innovative method involves recognizing a non-layout region that is free from main chips in a process pattern. It includes dividing this non-layout region into multiple rectangular sections, generating scribe data using these sections as dummy chips, and creating a dummy pattern for each of the dummy chips.

Career Highlights

Katsuhito Kojima is associated with Fujitsu Semiconductor Limited, where he applies his expertise in semiconductor manufacturing. His work has been instrumental in enhancing the efficiency and accuracy of reticle data generation.

Collaborations

Kojima has collaborated with notable colleagues such as Kenji Suzuki and Yukisada Horie. Their combined efforts contribute to advancements in semiconductor technology and innovation.

Conclusion

Katsuhito Kojima's contributions to the field of semiconductor technology through his innovative patent demonstrate his expertise and commitment to advancing the industry. His work continues to influence the development of efficient manufacturing processes.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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