Company Filing History:
Years Active: 2005-2014
Title: Katsuhiro Kitahashi: Innovator in Defect Observation Technology
Introduction
Katsuhiro Kitahashi is a notable inventor based in Hitachinaka, Japan. He has made significant contributions to the field of defect observation technology, holding a total of 3 patents. His work focuses on improving the detection and analysis of defects in various systems, particularly through advanced imaging techniques.
Latest Patents
Kitahashi's latest patents include a defect observation method and a defect observation device. The defect observation device features an input-output unit that processes information regarding a taught defect and its ideal output. It is designed to display processing results based on a determined set of image processing parameters. Additionally, the device includes an automatic determination unit that selects fewer image processing parameter sets, calculates results on input defect images, and determines the most effective parameter set based on a high coincidence degree.
His defect inspection method addresses the challenges of detecting minute defects in images with poor signal-to-noise ratios. By capturing images from opposing directions and applying subtraction and addition techniques, Kitahashi enhances the signal-to-noise ratio. This method allows for stable inspection of minute defects by comparing the processed images of defect and reference portions.
Career Highlights
Throughout his career, Katsuhiro Kitahashi has worked with prominent companies such as Hitachi, Ltd. and Hitachi High-Technologies Corporation. His experience in these organizations has contributed to his expertise in defect observation technologies and has facilitated the development of his innovative patents.
Collaborations
Kitahashi has collaborated with notable colleagues, including Takehiro Hirai and Akira Yoshikawa. Their combined efforts have likely played a role in advancing the technologies related to defect observation and inspection.
Conclusion
Katsuhiro Kitahashi is a distinguished inventor whose work in defect observation technology has led to significant advancements in the field. His innovative patents and career achievements reflect his commitment to improving defect detection methods.