Dayton, OH, United States of America

Kathleen Jo Frazier

This inventor holds 1 USPTO granted patent. Top assignee: Bae Systems Space & Mission Systems Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kathleen Jo Frazier. Retrieved from https://idiyas.com/inventor/kathleen-jo-frazier

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Kathleen Jo Frazier and Device Attestation

Introduction

Kathleen Jo Frazier is an inventor associated with Dayton, Ohio, and BAE Systems Space & Mission Systems Inc. Her patent work addresses ways to assess whether an electronic device is trustworthy and operating as intended.

Latest Patents

Frazier is associated with 1 patent, titled “Attestation of a Device Under Test.” The invention describes methods and systems for testing a device under test and sending the results to a trust verifier, which can determine whether the device passed or failed. To help protect the test from malware, the test logic is developed off the device and only machine code is provided to it. The verifier receives test results without being given the device’s memory values or other underlying data.

Career Highlights

Frazier’s documented patent contribution focuses on device attestation, a process that provides assurances about an electronic device’s integrity and operation. The patent describes an approach that limits the information exposed during verification while still allowing the verifier to evaluate test outcomes.

Collaborations

Frazier’s listed coworkers include Christopher Altick and Amy Sue Christopher. The available information identifies these professional associations but does not specify their roles in the patent.

Conclusion

Kathleen Jo Frazier’s patent work centers on secure device testing and attestation, with an emphasis on protecting test logic and limiting the data disclosed to a trust verifier.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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