The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 28, 2026

Filed:

Sep. 19, 2023
Applicant:

Bae Systems Space & Mission Systems Inc., Broomfield, CO (US);

Inventors:

Christopher Altick, Kettering, OH (US);

Amy Sue Christopher, Miamisburg, OH (US);

Kathleen Jo Frazier, Dayton, OH (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 21/57 (2013.01);
U.S. Cl.
CPC ...
G06F 21/57 (2013.01); G06F 2221/034 (2013.01);
Abstract

Attestation of an electronic device provides assurances that the device is trustworthy and operating as intended or, at least, within acceptable parameters. Methods and systems are provided herein wherein a device under test (DUT) is subject to tests, the results of which are provided to a trust verifier (TV) to indicate whether the DUT passed or failed. To protect the integrity of the test from being discovered by malware, the test logic is developed 'off board' and only machine code is provided to the DUT. Similarly, memory values and other data of the DUT are not revealed to the TV, which is only provided with test results.


Find Patent Forward Citations

Altick, Christopher. (2026). Attestation of a device under test (U.S. Patent No. 12613966). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12613966

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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