Christopher Altick

Title: Christopher Altick and Device Attestation

Introduction

Christopher Altick is an inventor based in Kettering, Ohio, and is associated with BAE Systems Space & Mission Systems Inc. His patent work addresses device trust and the verification of electronic devices.

Latest Patents

Altick is named on 1 patent, titled “Attestation of a Device Under Test.” The invention describes methods and systems for testing a device under test (DUT) and sending the results to a trust verifier, which can determine whether the device passed or failed. To help protect the test from discovery by malware, the test logic is developed off board, and only machine code is provided to the DUT. The verifier receives test results without access to the DUT’s memory values or other data.

Career Highlights

Altick’s listed patent reflects work on device attestation, a process intended to provide assurances that an electronic device is trustworthy and operating as intended or within acceptable parameters. His professional association is with BAE Systems Space & Mission Systems Inc.

Collaborations

The provided information lists Amy Sue Christopher and Kathleen Jo Frazier as Altick’s coworkers. Their specific roles or contributions to the patent are not stated.

Conclusion

Christopher Altick’s patent focuses on protecting the integrity of device testing while enabling a trust verifier to assess whether a device meets expected requirements.