Miamisburg, OH, United States of America

Amy Sue Christopher

This inventor holds 1 USPTO granted patent. Top assignee: Bae Systems Space & Mission Systems Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Amy Sue Christopher. Retrieved from https://idiyas.com/inventor/amy-sue-christopher

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Amy Sue Christopher and Device Attestation

Introduction

Amy Sue Christopher is an inventor associated with Miamisburg, Ohio, and BAE Systems Space & Mission Systems Inc. Her patent work addresses how to assess whether an electronic device is trustworthy and operating as intended.

Latest Patents

The available information identifies one patent associated with Christopher: “Attestation of a Device Under Test.” The invention describes methods and systems for testing a device under test and sending the results to a trust verifier, which can determine whether the device passed or failed. To help protect the test from malware, the test logic is developed off the device and only machine code is provided to it. The verifier receives test results rather than the device’s memory values and other internal data. Christopher is associated with 1 patent.

Career Highlights

Christopher’s listed patent reflects work on device security and verification. Its approach aims to provide assurances about a device’s integrity while limiting the information disclosed during the assessment.

Collaborations

The provided information lists Christopher Altick and Kathleen Jo Frazier as coworkers. It does not specify their roles in the patent or describe particular collaborations.

Conclusion

Amy Sue Christopher’s identified patent focuses on securely evaluating electronic devices while protecting test logic and limiting the disclosure of internal device data.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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