Kathi M Kreske

Title: Kathi M Kreske: Innovator in Optical Measurement Technologies

Introduction

Kathi M Kreske is a prominent inventor based in Petah Tikva, Israel. She has made significant contributions to the field of optical measurement technologies, holding two patents that showcase her innovative spirit and technical expertise.

Latest Patents

Kreske's latest patents include a method and apparatus for measuring the optical properties of optical devices. This invention involves a main converging lens positioned in front of an optical measuring system, which is capable of measuring collimation. The method utilizes a carrier with an auxiliary converging lens to receive a beam from the optical measuring system and reflect it back for analysis. The carrier's positioning is crucial, as it ensures that the optical device being tested is accurately measured for its reflective properties. Another notable patent is an optical examination apparatus that can function as a Fizeau interferometer, a schlieren device, and a moire deflectometer. This apparatus includes a point source of light and two optical systems that work together to collimate and direct the light for viewing.

Career Highlights

Kathi M Kreske has established herself as a key figure in her field through her innovative work at Rotlex Optics Ltd. Her patents reflect her commitment to advancing optical measurement techniques and her ability to solve complex problems in this domain.

Collaborations

Throughout her career, Kreske has collaborated with notable colleagues such as Oded Kafri and Eliezer Keren. These partnerships have likely contributed to her success and the development of her patented technologies.

Conclusion

Kathi M Kreske is a trailblazer in the field of optical measurement, with her patents demonstrating her innovative approach and technical prowess. Her work continues to influence the industry and inspire future advancements in optical technologies.