The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 08, 1989
Filed:
Nov. 23, 1987
Applicant:
Inventors:
Oded Kafri, Beersheva, IL;
Kathi M Kreske, Petah Tikva, IL;
Assignee:
Rotlex Optics Ltd., BeerSheba, IL;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
356359 ; 356 73 ; 356371 ;
Abstract
Optical examination apparatus is described including a basic setup comprising a point source of light, a first optical system forming a converging beam of light reflected from the examined object, and a second optical system located to receive the intercepted beam of reflected light, to collimate it, and to direct the collimated beam to a viewing device. The basic setup is capable of combined operation as a Fizeau interferometer, a schlieren device, and/or a moire deflectometer.