This inventor holds 1 USPTO granted patent. Top assignee: Xilinx, Inc.. Active years: 2012.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2012
Title: Katherine Seebeck: Innovator in Statistical Identification Methods
Introduction
Katherine Seebeck is a notable inventor based in Berthoud, Colorado. She has made significant contributions to the field of statistical identification of devices through her innovative methods and apparatus. Her work focuses on enhancing the accuracy and efficiency of semiconductor testing.
Latest Patents
Katherine holds a patent for a "Method and apparatus for statistical identification of devices based on parametric data." This invention provides a systematic approach for calculating maverick control limits. The method selects critical parameters and identifies the associated probability density functions. It also removes abnormal data points from parametric data sets, allowing for accurate categorization of semiconductor die into pass or fail categories. Katherine's patent represents a significant advancement in the field of semiconductor testing.
Career Highlights
Katherine is currently employed at Xilinx, Inc., a leading company in the field of programmable logic devices. Her role involves applying her expertise in statistical methods to improve product reliability and performance. With her innovative approach, she has contributed to the development of cutting-edge technologies in the semiconductor industry.
Collaborations
Katherine collaborates with Andrew John Flynn, a fellow innovator at Xilinx, Inc. Together, they work on projects that aim to enhance the efficiency of semiconductor testing and identification processes.
Conclusion
Katherine Seebeck's contributions to the field of statistical identification methods have made a significant impact on semiconductor testing. Her innovative patent and collaboration with industry professionals highlight her dedication to advancing technology.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile