The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 24, 2012
Filed:
Apr. 04, 2008
Katherine Seebeck, Berthoud, CO (US);
Andrew Flynn, Calverstown, IE;
Katherine Seebeck, Berthoud, CO (US);
Andrew Flynn, Calverstown, IE;
Xilinx, Inc., San Jose, CA (US);
Abstract
A method and apparatus is provided for the calculation of maverick control limits. The maverick control limit method selects the correct parameter(s) as critical parameters to be utilized by the maverick control limit method. Next, the maverick control limit method identifies the probability density function that is associated with the parametric data set(s) that are associated with the critical parameter(s). Next, abnormal data points within the measured parametric data set(s) are removed. Maverick control limits are then calculated to properly disposition semiconductor die into pass/fail categories.