Los Angeles, CA, United States of America

Kartik Lakhotia

This inventor holds 1 USPTO granted patent. Top assignee: Intel Corporation. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kartik Lakhotia. Retrieved from https://idiyas.com/inventor/kartik-lakhotia

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Kartik Lakhotia and In-Network Parallel Prefix Scan

Introduction

Kartik Lakhotia is an inventor based in Los Angeles, California, and works at Intel Corporation. His patent work describes a way to perform parallel prefix-scan calculations within a network as data packets move through its topology.

Latest Patents

Lakhotia is associated with 1 patent: “In-network parallel prefix scan” (also titled “Methods and apparatus for in-network parallel prefix scan”). The invention embeds a dual binary-tree topology in a network, with an up tree and a down tree. Input values enter at the leaves of the up tree, where aggregation nodes perform operations such as addition, multiplication, or maximum as packets travel toward the root. The up-tree results then feed the down tree, and packets travel from its root toward its leaves, where the prefix-scan outputs are provided.

Career Highlights

Lakhotia’s listed patent highlights an approach to carrying out computation within the network itself. By distributing aggregation across the tree structure as packets move, the method describes how prefix-scan operations can be integrated into network data flow.

Collaborations

The provided information identifies Intel Corporation as Lakhotia’s employer. It does not specify additional collaborators or organizations associated with the patent.

Conclusion

Kartik Lakhotia’s patent describes a dual-tree method for performing prefix-scan calculations as data packets traverse a network, reflecting his documented work at Intel Corporation.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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