Bengaluru, India

Kartik D Pai

This inventor holds 1 USPTO granted patent. Top assignee: Morgan Stanley Services Group Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kartik D Pai. Retrieved from https://idiyas.com/inventor/kartik-d-pai

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Kartik D. Pai: Inventor of a Live-Preview Report Customization System.

Introduction

Kartik D. Pai is an inventor based in Bengaluru, India, associated with Morgan Stanley Services Group Inc. His patent work focuses on making report customization more interactive and easier to review.

Latest Patents

Pai is credited with 1 patent, titled “Enabling Customizing Reports with Live Preview on One Screen.” The invention describes a configurable graphical user interface with multiple panels that let users control a report’s organization and appearance while viewing a real-time preview on the same screen. The panels can be configured separately and operate independently, communicating information about events in each panel. The system is designed to produce a report document that matches the appearance of the live preview.

Career Highlights

Pai’s disclosed invention addresses the practical challenge of adjusting a report and checking its appearance without switching between separate screens or workflows. By combining independent controls with an immediate preview, the system supports a more direct report-customization process.

Collaborations

Pai is associated with Morgan Stanley Services Group Inc. His coworker, Jithin Valat, is also noted in the provided information.

Conclusion

Kartik D. Pai’s patent presents a unified approach to report design, bringing configurable controls and a matching live preview together on one screen.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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