Karthik Purushothaman

Title: Karthik Purushothaman: Innovator in Metrology Guided Inspection

Introduction

Karthik Purushothaman is a notable inventor based in Chennai, India. He has made significant contributions to the field of metrology guided inspection through his innovative patent. His work focuses on enhancing the efficiency and accuracy of processes performed on specimens.

Latest Patents

Karthik holds a patent titled "Wafer signature local maxima via clustering for metrology guided inspection." This patent outlines methods and systems for generating information that aids in setting up processes performed on specimens. One of the key methods involves clustering dies on a specimen based on colors assigned to the dies, which are responsive to predicted defect densities determined from measurements. The process includes analyzing initial die clusters in location space to identify clusters containing two or more die clusters. The final die clusters are designated for use in setting up processes, ensuring improved accuracy and efficiency.

Career Highlights

Karthik is currently employed at Kla Corporation, where he applies his expertise in metrology and inspection technologies. His work at Kla Corporation has allowed him to contribute to advancements in the field, making significant strides in the development of innovative solutions.

Collaborations

Karthik collaborates with talented coworkers, including Alan Davila and Marcus Liesching. Their combined efforts foster a creative environment that drives innovation and enhances the quality of their work.

Conclusion

Karthik Purushothaman is a distinguished inventor whose contributions to metrology guided inspection are noteworthy. His patent reflects his commitment to improving processes in the field, and his work at Kla Corporation continues to influence advancements in technology.