This inventor holds 1 USPTO granted patent. Top assignee: International Business Machines Corporation. Active years: 1999.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 1999
Title: Karen Marie Badger: Inventor in Photolithographic Inspection
Introduction
Karen Marie Badger is an inventor associated with Milton, Vermont, and International Business Machines Corporation. Her patent work addresses inspection methods for photolithographic masks and printed wafers.
Latest Patents
Badger is credited with 1 patent: “Adaptive Inspection Method and System.” The invention describes a method for detecting design defects in a photolithographic mask or printed wafer. It derives an adaptive inspection algorithm that can inspect data with repeatable differences more tightly, while allowing less important differences to be removed without sacrificing inspection capability.
Career Highlights
Badger’s listed patent reflects work on improving the flexibility and precision of semiconductor inspection. She is associated with International Business Machines Corporation, commonly known as IBM.
Collaborations
Her listed coworkers include Brian J. Grenon and David S. O’Grady.
Conclusion
Karen Marie Badger’s patent focuses on adaptive inspection for photolithographic masks and printed wafers, balancing the removal of unimportant differences with rigorous defect detection.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile