Karel Urbanek

Title: The Innovative Contributions of Karel Urbanek

Introduction: Karel Urbanek is an accomplished inventor based in Atherton, California. With a remarkable portfolio of five patents, he has made significant contributions to the fields of optical detection and resistivity measurement.

Latest Patents: Among Urbanek's most recent innovations are two notable patents. The first is the "Dual Collector Optical Flaw Detector," which is designed to identify flaws in optically transmissive surfaces. This device utilizes a dual light collector system to gather scattered and diffracted light, ensuring accurate flaw detection in these surfaces. The second patent, the "Non-Contacting Resistivity Instrument with Structurally Related Measurement," allows for the computation of resistivity based on precise measurements of thickness and conductance. This sophisticated instrument employs a solenoid within an annular ferrite cup to measure conductance and utilizes acoustic wave technology for thickness measurements, providing a comprehensive solution for resistivity calculations.

Career Highlights: Karel Urbanek is currently affiliated with Tencor Instruments, where his innovative work continues to influence the industry. His extensive knowledge and experience in optical and material measurement technologies have positioned him as a notable figure in his field.

Collaborations: Throughout his career, Urbanek has worked alongside prominent colleagues, including George J. Kren and William R. Wheeler. Their collaborative efforts have contributed to the development of advanced measurement instruments and technologies, reflecting a strong partnership in innovation.

Conclusion: Karel Urbanek's work exemplifies the spirit of innovation, with his patents addressing complex challenges in optical flaw detection and resistivity measurement. As he continues to develop cutting-edge technologies at Tencor Instruments, Urbanek remains a key player in driving forward the landscape of industrial measurement solutions.