Turnov, Czechia

Karel Bla{circumflex Over (z)}ek

This inventor holds 1 USPTO granted patent. Top assignees: Crytur, Spol. S.r.o., Fyzikalni Ustav Av Cr, V.v.i.. Active years: 2018.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Karel Bla{circumflex Over (z)}ek. Retrieved from https://idiyas.com/inventor/karel-blacircumflex-over-zek

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2018

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1 patent (USPTO):Explore Patents

Title: Karel Blažek: Inventor in Scintillation Detection

Introduction

Karel Blažek is an inventor associated with Turnov, Czech Republic. His patent work includes a scintillation detector designed to detect ionizing radiation.

Latest Patents

Blažek is credited with 1 patent, titled “Scintillation Detector for Detection of Ionising Radiation.” The invention describes a detector built on a monocrystalline substrate, with nitride semiconductor layers and an active area made of alternating AlInGaN barrier and potential-well layers. The structure is designed to support radiative recombination of electrons and holes, enabling scintillation detection.

Career Highlights

Blažek’s listed professional affiliations include Crytur, spol. s r.o., and the Institute of Physics of the Czech Academy of Sciences (Fyzikální ústav AV ČR, v. v. i.). His patent reflects work involving semiconductor structures and radiation-detection technology.

Collaborations

Alice Hospodková and Eduard Hulicius are identified as Blažek’s coworkers. Their shared professional context connects them to research and development involving semiconductor technologies.

Conclusion

Karel Blažek’s recorded invention applies layered nitride semiconductor technology to the detection of ionizing radiation, highlighting his contribution to scintillation-detector innovation.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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