Mobara, Japan

Kaoru Yamada

This inventor holds 1 USPTO granted patent. Top assignee: Hitachi Displays, Ltd.. Active years: 2011.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kaoru Yamada. Retrieved from https://idiyas.com/inventor/kaoru-yamada-i6oaj8qj

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 8.0

ph-index = 1

Forward Citations = 4(Granted Patents)


Company Filing History:


Years Active: 2011

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1 patent (USPTO):Explore Patents

Title: Kaoru Yamada: Innovator in Display Technology

Introduction

Kaoru Yamada is a prominent inventor based in Mobara, Japan. He has made significant contributions to the field of display technology, particularly in the area of circuit pattern repair.

Latest Patents

Yamada holds a patent for an "Apparatus for repairing circuit pattern and method for manufacturing display apparatus using the same." This innovative technology addresses defects in pixel electrodes by utilizing a laser to remove short-circuited portions. The method involves comparing the defective pattern with a normal one, allowing for automatic repair of the substrate's pattern defect. This advancement is particularly beneficial in the manufacturing process of display apparatus, enhancing the display quality.

Career Highlights

Yamada is associated with Hitachi Displays, Ltd., where he has been instrumental in developing cutting-edge display technologies. His work has led to improvements in manufacturing processes, ensuring high-quality display properties.

Collaborations

Yamada has collaborated with notable colleagues, including Nobuaki Nakasu and Yuichiro Tanaka, contributing to various projects that push the boundaries of display technology.

Conclusion

Kaoru Yamada's innovative work in display technology exemplifies the impact of dedicated inventors in advancing manufacturing processes. His contributions continue to shape the future of display apparatus.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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