Tokyo, Japan

Kaori Iwafuchi

This inventor holds 2 USPTO granted patents and 2 published patent applications. Top assignee: Nec Corporation. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kaori Iwafuchi. Retrieved from https://idiyas.com/inventor/kaori-iwafuchi

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 2 

Average Co-Inventor Count = 8.0

ph-index = 1


Company Filing History:


Years Active: 2026

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2 patents (USPTO):Explore Patents

Title: Kaori Iwafuchi: Innovator in Deterioration Assessment Technology

Introduction

Kaori Iwafuchi is a prominent inventor based in Tokyo, Japan. She has made significant contributions to the field of deterioration assessment technology. Her innovative work focuses on developing devices and methods that enhance the accuracy of assessing the condition of various structures.

Latest Patents

Kaori Iwafuchi holds a patent for a "Deterioration assessment device, deterioration assessment method, and recording medium." This device includes a memory and at least one processor coupled to the memory. The processor performs operations such as acquiring information on displacement of a ground surface, extracting a position for sensor information used in deterioration assessment, and outputting the extracted position. This patent showcases her expertise in integrating technology with practical applications.

Career Highlights

Kaori is currently employed at NEC Corporation, where she continues to innovate and develop new technologies. Her work at NEC has allowed her to collaborate with other talented professionals in the field.

Collaborations

Some of her notable coworkers include Nana Jumonji and Yosuke Kimura. Their collective efforts contribute to advancing the technology in deterioration assessment.

Conclusion

Kaori Iwafuchi is a trailblazer in the field of deterioration assessment technology. Her patent and work at NEC Corporation highlight her commitment to innovation and excellence. Her contributions are paving the way for more effective assessment methods in various industries.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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