The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 19, 2026
Filed:
Dec. 01, 2020
Nec Corporation, Tokyo, JP;
Nana Jumonji, Tokyo, JP;
Kaori Iwafuchi, Tokyo, JP;
Yosuke Kimura, Tokyo, JP;
Chisato Sugawara, Tokyo, JP;
Takakazu Ishii, Tokyo, JP;
Daisuke Hashizume, Tokyo, JP;
Hiromichi Hirata, Tokyo, JP;
Shouhei Ohno, Tokyo, JP;
NEC CORPORATION, Tokyo, JP;
Abstract
A deterioration assessment device includes: a memory; and at least one processor coupled to the memory. The processor performs operations. The operations include: acquiring information on displacement of a ground surface; extracting a position at which sensor information used for assessment of deterioration is acquired based on the information on the displacement of the ground surface; and outputting the extracted position.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile