Mason, OH, United States of America

Kangming Ma

This inventor holds 1 USPTO granted patent and 1 published patent application and 1 EPO patent. Top assignee: Cognis Corporation. Active years: 2005.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kangming Ma. Retrieved from https://idiyas.com/inventor/kangming-ma

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 


Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2005

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1 patent (USPTO):Explore Patents

Title: Kangming Ma: Inventor of a Sampling Method for Detecting Low-Level Traits

Introduction

Kangming Ma is an inventor associated with Mason, Ohio, United States. His work includes a patented method and sampling device designed to detect low levels of a quality trait in an inhomogeneously distributed particulate sample.

Latest Patents

Ma is credited with 1 patent: “Method and Sampling Device for Detection of Low Levels of a Property/Quality Trait Present in an Inhomogeneously Distributed Sample Substrate.” The invention describes placing particulate material in a transparent, rotatable sample holder containing a tumbling member. As the holder rotates and the material tumbles, a spectrometer illuminates the sample and performs measurements. This approach is intended to improve detection of a predetermined trait that may be unevenly distributed throughout the sample.

Career Highlights

Ma’s listed company affiliations include Cognis Corporation and Cognis IP Management GmbH. His patent reflects an application of spectroscopy and sample handling to the analysis of particulate materials.

Collaborations

Among Ma’s listed coworkers are Ching-Hui Tseng and Daniel McFadden.

Conclusion

Kangming Ma’s patented sampling approach combines rotation, tumbling, and spectroscopic measurement to support the detection of low-level traits in unevenly distributed particulate samples.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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