The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 29, 2005
Filed:
Feb. 13, 2003
Ching-hui Tseng, West Chester, OH (US);
Kangming MA, Mason, OH (US);
Nan Wang, West Chester, OH (US);
Daniel Mcfadden, Cincinnati, OH (US);
Ching-Hui Tseng, West Chester, OH (US);
Kangming Ma, Mason, OH (US);
Nan Wang, West Chester, OH (US);
Daniel McFadden, Cincinnati, OH (US);
Cognis Corporation, Ambler, PA (US);
Abstract
A process for detecting low levels of a predetermined quality trait present in an inhomogeneously distributed particulate substrate involving the steps of: (a) providing a particulate substrate to be analyzed; (b) providing a spectrometer with an electromagnetic detector capable of performing spectroscopic measurements with electromagnetic radiation; (c) providing a rotatable sample holder having a transparent area through which electromagnetic radiation may pass; (d) providing a tumbling member located within the rotatable sample holder for tumbling the particulate substrate contained therein; (e) introducing the particulate substrate into the rotatable sample holder; (f) simultaneously rotating and tumbling the particulate substrate contained within the rotatable sample holder; and (g) activating the spectrometer, thereby illuminating the particulate substrate contained within the rotatable sample holder with electromagnetic radiation.