Kandiah Shivanandan

Title: The Innovative Contributions of Kandiah Shivanandan

Introduction

Kandiah Shivanandan is a notable inventor based in Bethesda, MD (US). He has made significant contributions to the field of imaging and semiconductor technology. With a total of 2 patents, his work has advanced the understanding and application of multiwavelength imaging systems.

Latest Patents

One of his latest patents is the "Multiwavelength imaging and spectroscopic photoemission microscope system." This innovative system simultaneously provides images across a broad range of the electromagnetic spectrum, including optical or visible light and infrared light. The system comprises a microscope, a spectrometer, a beam splitter, and two spectrum focal plane arrays, along with a cryogenic vessel to maintain low temperatures. This invention is particularly useful in failure analysis of integrated circuits and in semiconductor and low-temperature physics.

Another significant patent is the "Method for measuring thermal differences in infrared emissions from semiconductors." This method utilizes an image sensor with an array detector that produces signals corresponding to semiconductor radiation emissions. By employing a bandpass filter, the method effectively isolates specific wavelengths to identify performance-degrading phenomena in semiconductor devices.

Career Highlights

Throughout his career, Kandiah Shivanandan has worked with reputable organizations, including General Research Corporation and the Institute of Microelectronics. His experience in these institutions has contributed to his expertise in the field of semiconductor technology and imaging systems.

Collaborations

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Conclusion

Kandiah Shivanandan's innovative patents and career achievements highlight his significant contributions to the fields of imaging and semiconductor technology. His work continues to influence advancements in these areas, showcasing the importance of innovation in modern science.