Yokohama, Japan

Kanako Harada


Average Co-Inventor Count = 3.4

ph-index = 2

Forward Citations = 22(Granted Patents)


Company Filing History:


Years Active: 2004-2005

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2 patents (USPTO):Explore Patents

Title: Kanako Harada: Innovator in Semiconductor Inspection Technologies

Introduction

Kanako Harada is a prominent inventor based in Yokohama, Japan. She has made significant contributions to the field of semiconductor inspection technologies. With a total of 2 patents, her work focuses on enhancing the efficiency and precision of inspection processes in semiconductor manufacturing.

Latest Patents

Her latest patents include an "Inspection Condition Setting Program, Inspection Device and Inspection System." This program is designed to efficiently and precisely set the inspection conditions of devices that detect particles and deformed patterns in products such as semiconductor integrated circuits. The system notably improves the efficiency of setting cell comparison regions and non-inspection regions. It executes various processes, including input processing of product type codes and chip size information, as well as extraction processing of repeated pattern region coordinates.

Another significant patent is the "Inspection Data Analysis Program, Defect Inspection Apparatus, Defect Inspection System and Method for Semiconductor Device." This invention involves reading inspection data output from an inspection apparatus, which contains crucial information about particle or pattern defects. The extracted information is then compared with pre-registered determination criteria to identify detection errors.

Career Highlights

Throughout her career, Kanako Harada has worked with notable companies, including Hitachi, Ltd. and Hitachi High-Technologies Corporation. Her experience in these organizations has allowed her to develop and refine her innovative ideas in semiconductor inspection.

Collaborations

She has collaborated with esteemed colleagues such as Makoto Ono and Hisafumi Iwata, contributing to the advancement of technology in her field.

Conclusion

Kanako Harada's contributions to semiconductor inspection technologies demonstrate her commitment to innovation and excellence. Her patents reflect her expertise and dedication to improving manufacturing processes. Her work continues to influence the industry and inspire future advancements.

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