This inventor holds 1 USPTO granted patent. Top assignees: Mettler Toledo (Changzhou) Measurement Technology Ltd., Mettler-Toledo (Changzhou) Precision Instruments Ltd., Mettler-Toledo International Trading (Shanghai) Co., Ltd.. Active years: 2025.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2025
Title: The Innovative Contributions of Kan Liu
Introduction
Kan Liu is a notable inventor based in Changzhou, China. He has made significant strides in the field of measurement technology, particularly with his innovative approach to weighing methods. His work has implications for various industries that rely on precise measurements.
Latest Patents
One of Kan Liu's key patents is titled "Method of weighing using object recognition and device therefor." This patent describes a method that involves recognizing multiple objects placed within an object recognition area of a weighing platform. The method enhances the accuracy and efficiency of weighing by simplifying the object recognition process and improving the overall precision of measurements. Liu's invention is particularly advantageous as it reduces the complexity of the operation flow and the time required for accurate weighing.
Career Highlights
Kan Liu has worked with prominent companies in the measurement technology sector, including Mettler Toledo Measurement Technology Ltd. and Mettler Toledo Precision Instruments Ltd. His experience in these organizations has contributed to his expertise in developing innovative weighing solutions.
Collaborations
Throughout his career, Kan Liu has collaborated with talented individuals such as Song Zhang and Shenhui Wang. These collaborations have likely fostered an environment of innovation and creativity, leading to advancements in measurement technology.
Conclusion
Kan Liu's contributions to the field of weighing technology demonstrate his commitment to innovation and precision. His patented methods and collaborative efforts highlight the importance of advancements in measurement technology.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile