The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 27, 2025
Filed:
Jul. 29, 2020
Mettler-toledo (Changzhou) Measurement Technology Ltd., Changzhou, CN;
Mettler-toledo (Changzhou) Precision Instruments Ltd., Changzhou, CN;
Mettler-toledo International Trading (Shanghai) Co., Ltd., Shanghai, CN;
Song Zhang, Changzhou, CN;
Kan Liu, Changzhou, CN;
Shenhui Wang, Changzhou, CN;
Zhiqiang Wang, Changzhou, CN;
Kai Yin, Changzhou, CN;
Mettler-Toledo (Changzhou) Measurement Technology Ltd., Changzhou, CN;
Mettler-Toledo (Changzhou) Precision Instruments Ltd., Changzhou, CN;
Mettler-Toledo International Trading (Shanghai) Co., Ltd., Shanghai, CN;
Abstract
A method of weighing using a scale () comprises the steps of: recognizing at least one of a plurality of objects placed within an object recognition area (A) of a platform () of the scale (), and weighing the plurality of objects placed on the platform () of the scale () to determine a total weight of the plurality of objects. A weighing device () comprises the platform () configured as a plane, and utilizes the aforementioned weighing method. The method of weighing is advantageous in that it reduces the difficulty of object recognition using an algorithm by increasing the degree to which the object on the weighing platform fits the algorithm, reduces the complexity of the operation flow and the time required, and effectively increases the precision and accuracy of object recognition.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile