Huddersfield, United Kingdom

Kaiwei Wang

This inventor holds 2 USPTO granted patents. Top assignees: Ibs Precision Engineering B.v., University of Huddersfield of Queensgate. Active years: 2011-2016.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kaiwei Wang. Retrieved from https://idiyas.com/inventor/kaiwei-wang

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 50.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2011-2016

Loading Chart...
2 patents (USPTO):Explore Patents

Title: Innovations by Inventor Kaiwei Wang

Introduction

Kaiwei Wang is a notable inventor based in Huddersfield, GB. He has made significant contributions to the field of optical measurement technologies, with a focus on surface characterization. With two patents to his name, Wang has developed innovative apparatuses that enhance the understanding and analysis of surface characteristics in various materials.

Latest Patents

One of Wang's latest patents is a **Surface Characteristic Determining Apparatus**. This invention employs a wavelength selector to pick wavelengths from a broadband light source. A light director then channels light from the wavelength selector along both a measurement path directed at a sample surface and a reference path aimed at a reference surface. The interference of the reflected light produces an interferogram, while a controller regulates the wavelength selected. A recorder captures successive images of the interferogram across different selected wavelengths. Ultimately, the data processor processes these images to generate surface profiles and height maps of the sample surface. To compensate for environmental factors like vibration and thermal effects, the reference path can be adjusted accordingly, thereby ensuring accuracy in measurements.

Another notable patent from Wang is also a **Surface Characteristic Determining Apparatus**, which combines light from two different wavelength sources. This light is directed to a reference surface and sample surface, generating interference patterns that reveal essential surface characteristics. This apparatus utilizes non-mechanical scanning techniques to achieve high precision and is designed to adapt to environmental variations through adjustments in path length or refractive indices.

Career Highlights

Throughout his career, Kaiwei Wang has worked with prestigious organizations, including Ibs Precision Engineering B.V. and the University of Huddersfield at Queensgate. His work in these institutions has contributed to the advancement of optical engineering and measurement systems.

Collaborations

Wang has collaborated with esteemed colleagues such as Xiangqian Jiang and Feng Gao. These partnerships have facilitated the exchange of ideas and research, leading to innovative solutions in surface characterization technologies.

Conclusion

In conclusion, Kaiwei Wang's inventive spirit and dedication are evident in his contributions to optical measurement. His advanced patents illustrate his expertise and commitment to enhancing the field of surface characteristics determination. As a pioneer in his sector, Wang continues to inspire up-and-coming inventors and researchers aiming to innovate in technology and engineering.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…