The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 20, 2016

Filed:

Jan. 15, 2010
Applicants:

Xiangqian Jiang, Huddersfield, GB;

Kaiwei Wang, Huddersfield, GB;

Feng Gao, Huddersfield, GB;

Hussam Muhamedsalih, Huddersfield, GB;

Inventors:

Xiangqian Jiang, Huddersfield, GB;

Kaiwei Wang, Huddersfield, GB;

Feng Gao, Huddersfield, GB;

Hussam Muhamedsalih, Huddersfield, GB;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 11/02 (2006.01); G01B 9/02 (2006.01); G01B 11/24 (2006.01);
U.S. Cl.
CPC ...
G01B 9/02068 (2013.01); G01B 9/02007 (2013.01); G01B 9/0209 (2013.01); G01B 9/02077 (2013.01); G01B 9/02084 (2013.01); G01B 11/2441 (2013.01); G01B 2290/65 (2013.01);
Abstract

A wavelength selector () selects a wavelength of a broadband light source (). A light director (BS, BS) directs light from the wavelength selector along a measurement path towards a region of a sample surface and along a reference path towards a reference surface, such that light reflected by the region of the sample surface and light reflected by the reference surface interfere to produce an interferogram. A controller () controls the wavelength selector to change the wavelength selected by the wavelength selector. A recorder () records successive images, each image representing the interferogram produced by a respective one of the wavelengths selected by the wavelength selector. A data processor () processes the recorded images to produce at least one of a surface profile and a surface height map of at least a part of the sample surface. The reference path may be controlled to compensate for environmental effects such as vibration, thermal effects and air turbulence. The data processor may use a graphics processing unit to enable pixel data to be processed in parallel.


Find Patent Forward Citations

Jiang, Xiangqian. (2016). Surface characteristic determining apparatus (U.S. Patent No. 9448057). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9448057

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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