This inventor holds 2 USPTO granted patents and 2 EPO patents. Top assignees: Bruker Axs Gmbh, Other. Active years: 2010-2019.
Company Filing History:
1 out of 54 
1 out of 834,411 Years Active: 2010-2019
Title: Innovations by Inventor Kai Uwe Mettendorf
Introduction
Kai Uwe Mettendorf is a notable inventor based in Karlsruhe, Germany. He has made significant contributions to the field of X-ray optics and diffractometry. With a total of 2 patents, Mettendorf's work has advanced the capabilities of X-ray measurement technologies.
Latest Patents
Mettendorf's latest patents include an innovative X-ray optics assembly with a switching system for three beam paths and an associated X-ray diffractometer. This X-ray optics assembly features a multilayer mirror, specifically a Goebel mirror, and a switching system that allows for the selection of beam paths for an X-ray beam. The assembly includes a monochromator, particularly a channel-cut crystal, enabling three selectable beam paths. The invention enhances the versatility of X-ray diffractometers for various measurement geometries.
Another significant patent is an X-ray diffractometer designed for mechanically correlated movement of the source, detector, and sample position. This diffractometer employs a mechanism without a toothed ring, allowing simultaneous and correlated movement of the goniometer legs, which hold the source and detector. The design includes a common main center of rotation and auxiliary centers of rotation, facilitating precise movement along a symmetrical guidance system.
Career Highlights
Throughout his career, Mettendorf has worked with Bruker AXS GmbH, where he contributed to the development of advanced X-ray technologies. His expertise in the field has positioned him as a key figure in the innovation of X-ray measurement systems.
Collaborations
Mettendorf has collaborated with notable professionals in his field, including Claus Bolzinger and Frank Hans Hoffman. These collaborations have further enriched his work and contributed to the advancement of X-ray technology.
Conclusion
Kai Uwe Mettendorf's contributions to X-ray optics and diffractometry demonstrate his innovative spirit and commitment to advancing measurement technologies. His patents reflect a deep understanding of the complexities involved in X-ray systems, paving the way for future developments in the field.