Company Filing History:
Years Active: 2007
Title: Innovations by Inventor Kai Kuparinen
Introduction
Kai Kuparinen is a notable inventor based in Siuntio, Finland. He has made significant contributions to the field of material analysis through his innovative patent. His work focuses on advanced measurement techniques that enhance the understanding of material compositions.
Latest Patents
Kai Kuparinen holds a patent for a "Measurement apparatus and method for determining the material composition of a sample by combined X-ray fluorescence analysis and laser-induced breakdown spectroscopy." This invention provides a sophisticated method for determining the material composition of a sample. The apparatus includes an X-ray fluorescence detector that detects fluorescent X-rays emitted from the sample when irradiated with incident X-rays. Additionally, a laser source produces a laser beam that is focused onto the sample's surface. An optical sensor detects the optical emissions from the sample's particles when exposed to the laser beam. Furthermore, a gas administration subsystem is designed to controllably deliver gas to the area around the focal spot.
Career Highlights
Kai Kuparinen is associated with Oxford Instruments Analytical Oy, where he applies his expertise in developing innovative measurement technologies. His work has contributed to advancements in material analysis, making significant impacts in various scientific fields.
Collaborations
Kai collaborates with talented professionals, including Heikki Sipilä and Tero Eklin, who contribute to the innovative environment at Oxford Instruments Analytical Oy.
Conclusion
Kai Kuparinen's innovative work in measurement technology exemplifies the importance of advancements in material analysis. His contributions continue to influence the field and pave the way for future innovations.