The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 19, 2007
Filed:
May. 20, 2005
Applicants:
Heikki Johannes Sipilä, Espoo, FI;
Tero Eklin, Espoo, FI;
Kai Kuparinen, Sluntio, FI;
Inventors:
Assignee:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 23/233 (2006.01);
U.S. Cl.
CPC ...
Abstract
A measurement apparatus and method are provided for determining the material composition of a sample. An X-ray fluorescence detector () detects fluorescent X-rays coming from said sample under irradiation with incident X-rays. A laser source () is adapted to produce a laser beam. Focusing optics () focus said laser beam into a focal spot on a surface of said sample. An optical sensor () detects optical emissions coming from particles of said sample upon being exposed to said laser beam at said focal spot. A gas administration subsystem () is adapted to controllably deliver gas to a space () around said focal spot.