Marbach, Switzerland

Jürg Hinderlng

This inventor holds 1 USPTO granted patent. Top assignee: Leica Geosystems Ag. Active years: 2014.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jürg Hinderlng. Retrieved from https://idiyas.com/inventor/jürg-hinderlng

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2014

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1 patent (USPTO):Explore Patents

Title: Jürg Hinderlng: Innovator in Optical Measurement Technology

Introduction

Jürg Hinderlng is a notable inventor based in Marbach, Switzerland. He has made significant contributions to the field of optical measurement technology, particularly with his innovative designs that enhance distance measurement accuracy.

Latest Patents

Hinderlng holds a patent for a two-sided reflector and two-sided target object. This invention features a two-sided reflector designed for the reflection of a diffraction-limited optical beam bundle. The reflector comprises a planar first and second reflection element, such as a reflection film and a cat's eye reflector. These elements are strategically arranged concerning a reference axis, resulting in an absolute addition constant of zero. This design allows for precise distance measurement that corresponds directly to a natural surface without the need for additional corrections.

Career Highlights

Jürg Hinderlng is associated with Leica Geosystems AG, a company renowned for its advanced measurement and surveying technologies. His work has contributed to the development of tools that are essential for accurate distance measurement in various applications.

Collaborations

Hinderlng has collaborated with notable colleagues, including Mirko Wiebking and Christian Schorr. Their combined expertise has furthered advancements in optical measurement technologies.

Conclusion

Jürg Hinderlng's innovative contributions to optical measurement technology, particularly through his patented designs, have established him as a key figure in the field. His work continues to influence the accuracy and efficiency of distance measurement techniques.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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