The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 09, 2014

Filed:

Sep. 18, 2006
Applicants:

Mirko Wiebking, Heerbrugg, CH;

Christian Schorr, Widnau, CH;

Jürg Hinderlng, Marbach, CH;

Inventors:

Mirko Wiebking, Heerbrugg, CH;

Christian Schorr, Widnau, CH;

Jürg Hinderlng, Marbach, CH;

Assignee:

Leica Geosystems AG, Heerbrugg, CH;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 5/08 (2006.01); G02B 5/12 (2006.01); G01C 15/02 (2006.01);
U.S. Cl.
CPC ...
G02B 5/12 (2013.01); G01C 15/02 (2013.01);
Abstract

A two-sided reflector for the reflection of a diffraction-limited optical beam bundle is embodied such that a planar first and second reflection element such as, for example, a reflection film and a cat's eye reflector are arranged with respect to a reference axis of the reflector in such a way that an absolute addition constant of zero results from the targeted choice of the properties of the first and second reflection element and the arrangement thereof with respect to the reference axis for a distance measurement. The distance measurement therefore essentially corresponds to a distance measurement on a natural surface. The distance measurement can therefore be referred directly to the reference axis without additional correction.


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