Rotkreuz, Switzerland

Jürg Haas

This inventor holds 1 USPTO granted patent and 2 EPO patents. Top assignee: Landis+gyr Ag. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jürg Haas. Retrieved from https://idiyas.com/inventor/jürg-haas

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Jürg Haas: Innovator in Data Audit Trail Technology

Introduction

Jürg Haas is a notable inventor based in Rotkreuz, Switzerland. He has made significant contributions to the field of data management, particularly in establishing data audit trails for meter data. His innovative approach enhances the reliability and security of data handling in various applications.

Latest Patents

Jürg Haas holds a patent for a "Method, meter, and system for data audit trail." This invention relates to a method of establishing a data audit trail for meter data. The method involves capturing a meter dataset that includes at least a first value and a second value. It also includes signing the meter dataset with a first digital signature and subsequently signing the next meter dataset along with the first digital signature using a second digital signature. This process ensures the integrity and traceability of meter data.

Career Highlights

Jürg Haas is associated with Landis+Gyr AG, a leading company in energy management solutions. His work at Landis+Gyr AG has positioned him as a key player in the development of innovative technologies that improve data accuracy and security in metering systems.

Collaborations

Throughout his career, Jürg has collaborated with talented professionals, including Franz Buholzer and Jani Maaranen. These collaborations have contributed to the advancement of technology in the field of data management.

Conclusion

Jürg Haas is a distinguished inventor whose work in data audit trail technology has made a significant impact on the industry. His innovative methods and dedication to improving data integrity continue to influence the field positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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