The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 01, 2026
Filed:
Dec. 01, 2021
Applicant:
Landis+gyr Ag, Cham, CH;
Inventor:
Jürg Haas, Rotkreuz, CH;
Assignee:
LANDIS+GYR AG, Cham, CH;
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01D 4/00 (2006.01); H04L 9/00 (2022.01); H04L 9/30 (2006.01); H04L 9/32 (2006.01);
U.S. Cl.
CPC ...
G01D 4/004 (2013.01); H04L 9/30 (2013.01); H04L 9/3236 (2013.01); H04L 9/3247 (2013.01); H04L 9/3297 (2013.01);
Abstract
The present invention relates to a method of establishing a data audit trail for meter data of a meter. The method comprises the steps of capturing a meter dataset comprising at least a first value and a second value, signing the meter dataset with a first digital signature, and subsequently signing a next meter dataset and the first digital signature with a second digital signature.
Quick Actions:
Haas, Jürg. (2026). Method, meter, and system for data audit trail (U.S. Patent No. 12723895). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12723895
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile