Vatilieu, France

Jérôme Guichard

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: E2v Semiconductors. Active years: 2011.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jérôme Guichard. Retrieved from https://idiyas.com/inventor/jérôme-guichard

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0


Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 11(Granted Patents)


Company Filing History:


Years Active: 2011

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1 patent (USPTO):Explore Patents

Title: The Innovative Contributions of Jérôme Guichard

Introduction

Jérôme Guichard is a notable inventor based in Vatilieu, France. He has made significant contributions to the field of dental technology, particularly with his innovative approach to dental radiology.

Latest Patents

Guichard holds a patent for a dental radiology image sensor with soft overmolding. This invention relates to an intra-oral dental radiology sensor that comprises an electronic image acquisition module and a molded casing made of hard plastic. The casing is enhanced with overmoldings made of a softer plastic, which improves patient comfort and protects the module against shocks without increasing its size. The soft plastic is preferably a copolymer of the SEBS type, while the hard plastic is typically a polyamide.

Career Highlights

Jérôme Guichard is associated with E2V Semiconductors, where he applies his expertise in developing advanced imaging technologies. His work focuses on enhancing the functionality and comfort of dental imaging devices.

Collaborations

One of his notable coworkers is Florian Julien, with whom he collaborates on various projects within the company.

Conclusion

Jérôme Guichard's innovative work in dental radiology exemplifies the importance of advancements in medical technology. His contributions continue to improve patient experiences and the effectiveness of dental imaging.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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