Holzgerlingen, Germany

Jurgen Serrer

This inventor holds 1 USPTO granted patent. Top assignee: Adv Antest Corporation. Active years: 2018.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jurgen Serrer. Retrieved from https://idiyas.com/inventor/jurgen-serrer

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2018

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1 patent (USPTO):Explore Patents

Title: Jurgen Serrer: Innovator in Scan Optimization Technology

Introduction

Jurgen Serrer is a notable inventor based in Holzgerlingen, Germany. He has made significant contributions to the field of scan optimization technology, particularly in improving the efficiency of automated test equipment (ATE).

Latest Patents

Serrer holds a patent for a system and method designed to optimize scan speed for input and output paths. The patent, titled "Scan speed optimization of input and output paths," discloses a scan optimizer that generates optimal ATE input/output timing with minimal margin while ensuring stable results. This innovation greatly enhances scan test time, making it a valuable advancement in the industry.

Career Highlights

Jurgen Serrer is currently employed at Advantest Corporation, where he continues to develop and refine technologies that improve testing processes. His work has been instrumental in advancing the capabilities of automated testing systems.

Collaborations

Serrer collaborates with Martin Fischer, a fellow innovator, to further enhance their contributions to the field of scan optimization.

Conclusion

Jurgen Serrer is a key figure in the realm of scan optimization technology, with a focus on improving automated testing processes. His innovative patent and ongoing work at Advantest Corporation highlight his commitment to advancing technology in this critical area.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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