Darmstadt, Germany

Jurgen Paetow

This inventor holds 1 USPTO granted patent. Top assignee: Hottinger Baldwin Measurements Inc.. Active years: 1982.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jurgen Paetow. Retrieved from https://idiyas.com/inventor/jurgen-paetow

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 1.0

ph-index = 1

Forward Citations = 12(Granted Patents)


Company Filing History:


Years Active: 1982

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1 patent (USPTO):Explore Patents

Title: Jurgen Paetow: Innovator in Strain Gage Technology

Introduction

Jurgen Paetow is a notable inventor based in Darmstadt, Germany. He has made significant contributions to the field of strain gage technology. His innovative approach has led to the development of a unique patent that addresses challenges in load applications.

Latest Patents

Jurgen Paetow holds a patent for a "Strain gage pick-up and method for adjusting such strain gage pick-up." This invention focuses on compensating for off-center load applications to strain gage pick-ups or transducers. The method involves providing additional strain gage components that shift the effective position of the strain gage device on its supporting spring body. This adjustment allows for improved sensitivity and accuracy in measuring loads, enhancing the overall performance of the transducer.

Career Highlights

Jurgen Paetow is associated with Hottinger Baldwin Measurements Inc., a company known for its expertise in measurement technology. His work at the company has allowed him to apply his innovative ideas in practical settings, contributing to advancements in measurement solutions.

Collaborations

Due to space constraints, the details of collaborations will not be included.

Conclusion

Jurgen Paetow's contributions to strain gage technology exemplify the impact of innovative thinking in engineering. His patent reflects a commitment to enhancing measurement accuracy and efficiency. His work continues to influence the field and inspire future innovations.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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