Framingham, MA, United States of America

Hottinger Baldwin Measurements Inc.

Calculating rank
USPTO Granted Patents = 22


Forward Citations = 263

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17 inventors (with patents filed for the assignee):

goldMedal Harry E Lockery (7 out of 17 patents)

silverMedal Eric Laimins (5 out of 5 patents)

bronzeMedal Manfred Kreuzer (2 out of 4 patents)

4.  Randall K Hopkins (2 out of 4 patents)

5.  Reimar Hellwig (2 out of 2 patents)

6.  Werner Julius Ort (2 out of 6 patents)

7.  Peter Ackermans (1 out of 1 patent)

8.  Gerard Kerkhofs (1 out of 1 patent)

9.  Edwin Schild (1 out of 1 patent)

10.  Thomas W Hansson (1 out of 2 patents)

11.  Randall B Rubinstein (1 out of 2 patents)

12.  Ralf Waegner (1 out of 6 patents)

13.  Joseph H Antkowiak (1 out of 1 patent)

14.  Harold O Ballou (1 out of 1 patent)

15.  Jurgen Paetow (1 out of 1 patent)


22 patents:

Company Overview
Hottinger Baldwin Measurements Inc. specializes in precision measurement and testing solutions, focusing on various sectors including automotive, aerospace, and industrial applications. The company is known for its advanced sensor technology, data acquisition systems, and software solutions that enhance measurement accuracy and reliability. With a strong emphasis on research and development, it aims to provide innovative solutions that meet the evolving needs of its global clientele, particularly in the field of mechanical and electrical engineering.
Profile summary synthesized from public USPTO records and patent filings.

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USPTO Data Jan 1 1976 - Oct 20 2026

22 Patents

#10 in Framingham, MA

#907 in Massachusetts

#15,051 in US

#28,807 in the World

Framingham, MA (US)
Framingham, MA, United States of America
Forward Citations = 263

17 inventors:

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Hottinger Baldwin Measurements Inc.. Retrieved from https://idiyas.com/company/hottinger-baldwin-measurements

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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