Company Filing History:
2 out of 30,061 
1 out of 112 
Years Active: 2011-2016
Title: Jürgen Durst: Innovator in X-ray Imaging Technology
Introduction
Jürgen Durst is a notable inventor based in Dittenheim, Germany. He has made significant contributions to the field of X-ray imaging technology, holding two patents that showcase his innovative methods for examining objects using advanced X-ray recording systems.
Latest Patents
Durst's latest patents include a method for examining an object using an X-ray recording system for phase contrast imaging with displacement measurement. This method involves aligning the object in the X-ray beam and the recording system, allowing for the measurement of free fields. During the X-ray image recording, components are moved relative to one another, and a reference image is captured to determine the position of the components. The image information is derived from partial images, displacements, and reference phases.
Another patent focuses on a method for examining an object using an X-ray recording system for phase contrast imaging with stochastic phase scanning. This method also involves moving components during the X-ray image recording and generating the recording from multiple partial images. The intensity in each pixel is determined, and the image information is compiled from the partial images and displacements.
Career Highlights
Throughout his career, Jürgen Durst has worked with prominent organizations such as Siemens Aktiengesellschaft and Friedrich-Alexander-Universität Erlangen-Nürnberg. His experience in these institutions has contributed to his expertise in X-ray imaging technology.
Collaborations
Durst has collaborated with notable colleagues, including Gisela Anton and Florian Bayer. Their joint efforts have likely enhanced the development of innovative solutions in the field of imaging technology.
Conclusion
Jürgen Durst's contributions to X-ray imaging technology through his patents and collaborations highlight his role as an influential inventor. His work continues to impact the field and advance the capabilities of X-ray examination methods.