Siemens Aktiengesellschaft

Friedrich-Alexander-Universitat Erlangen-Nürnberg

Jürgen Durst

Gisela Anton

Thilo Michel

Thomas Weber

Florian Bayer

Georg Pelzer

Jens Rieger

Daniel Niederlöhner

Markus Firsching

Michael Böhnel

Alexander Korn

A method, for examining an object using an X-ray recording system, includes aligning the object in the X-ray beam and the X-ray recording system with one another such that regions in the X-ray beam are uncovered for measurement of a free field. During an X-ray image recording, the components are moved relative to one another with a lateral displacement. In a position of the relative lateral displacement of the components, a reference image containing free fields is recorded. The X-ray image recording is generated from partial images during the displacement and the position of the second component relative to the first component is determined for each partial recording such that the displacement distances of the displacements and the reference phases are calculated from a selected set of pixels and the measured intensity values thereof. Finally, the image information is determined from the partial images, the displacements and the reference phases.

Method for examining an object using an X-ray recording system for phase contrast imaging with displacement measurement

A method, for examining an object using an X-ray recording system, includes during an X-ray image recording, moving components relative to one another with the lateral displacement by displacement distances. The method includes generating the X-ray image recording during the displacement from n partial images, so that the total exposure time of the X-ray image recording is made up from a sum of partial exposure times. In each of the partial images, the intensity is determined in each pixel. The position of the second component relative to the first component is determined for each recording of the partial images. Finally, the image information is determined from the partial images and the displacements.

Method for examining an object using an X-ray recording system for phase contrast imaging with stochastic phase scanning

The present invention relates to a device and method for determining one or more characteristics of radiation using a sensor comprising one or more detector units capable of counting the number of photon or charged particle of said radiation impinging on said sensor in or above a determined energy range.

Method and apparatus for determining one or more characteristics of radiation

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Dittenheim, Germany

Jürgen Durst