The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 22, 2016
Filed:
Sep. 17, 2014
Siemens Aktiengesellschaft, Munich, DE;
Gisela Anton, Erlangen, DE;
Florian Bayer, Hemhofen, DE;
Jürgen Durst, Dittenheim, DE;
Thilo Michel, Nürnberg, DE;
Georg Pelzer, Eggenfelden, DE;
Jens Rieger, Forchheim, DE;
Thomas Weber, Erlangen, DE;
SIEMENS AKTIENGESELLSCHAFT, Munich, DE;
Abstract
A method, for examining an object using an X-ray recording system, includes during an X-ray image recording, moving components relative to one another with the lateral displacement by displacement distances. The method includes generating the X-ray image recording during the displacement from n partial images, so that the total exposure time of the X-ray image recording is made up from a sum of partial exposure times. In each of the partial images, the intensity is determined in each pixel. The position of the second component relative to the first component is determined for each recording of the partial images. Finally, the image information is determined from the partial images and the displacements.