Company Filing History:
Years Active: 2016
Title: Innovations by Georg Pelzer in X-ray Imaging Technology
Introduction
Georg Pelzer is a notable inventor based in Eggenfelden, Germany. He has made significant contributions to the field of X-ray imaging technology, particularly in methods that enhance the examination of objects using advanced imaging systems. With a total of two patents to his name, Pelzer's work reflects a commitment to innovation and precision in imaging techniques.
Latest Patents
Pelzer's latest patents include a method for examining an object using an X-ray recording system for phase contrast imaging with displacement measurement. This method involves aligning the object in the X-ray beam and the recording system to uncover regions for measurement. During the recording, components are moved relative to one another, allowing for the generation of an X-ray image from partial images. The displacement distances and reference phases are calculated from selected pixels and intensity values, ultimately determining the image information from the partial images.
Another significant patent by Pelzer is a method for examining an object using an X-ray recording system for phase contrast imaging with stochastic phase scanning. This method also involves moving components relative to one another during the X-ray image recording. The total exposure time is composed of partial exposure times, with intensity determined in each pixel of the partial images. The image information is derived from the partial images and displacements, showcasing Pelzer's innovative approach to X-ray imaging.
Career Highlights
Georg Pelzer is associated with Siemens Aktiengesellschaft, a leading global technology company. His work at Siemens has allowed him to develop and refine his innovative methods in X-ray imaging, contributing to advancements in medical and industrial applications. Pelzer's expertise in this field has positioned him as a key figure in the ongoing evolution of imaging technology.
Collaborations
Pelzer has collaborated with notable colleagues such as Gisela Anton and Florian Bayer. These collaborations have fostered an environment of innovation and shared knowledge, further enhancing the development of advanced imaging techniques.
Conclusion
Georg Pelzer's contributions to X-ray imaging technology through his innovative patents demonstrate his expertise and commitment to advancing the field. His work continues to influence the way objects are examined, paving the way for future developments in imaging technology.