Forchheim, Germany

Jens Rieger

This inventor holds 2 USPTO granted patents. Top assignee: Siemens Aktiengesellschaft. Active years: 2016.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Jens Rieger. Retrieved from https://idiyas.com/inventor/jens-rieger-35t4k8g2

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 7.0

ph-index = 1


Company Filing History:


Years Active: 2016

Loading Chart...
2 patents (USPTO):Explore Patents

Title: Jens Rieger: Innovator in X-ray Imaging Technology

Introduction

Jens Rieger is a notable inventor based in Forchheim, Germany. He has made significant contributions to the field of X-ray imaging technology, holding 2 patents that showcase his innovative methods for examining objects using advanced imaging techniques.

Latest Patents

Rieger's latest patents include a method for examining an object using an X-ray recording system for phase contrast imaging with displacement measurement. This method involves aligning the object in the X-ray beam and the recording system, allowing for the measurement of free fields during the X-ray image recording. The components are moved relative to one another, and a reference image is recorded to determine the displacement distances and reference phases from selected pixels.

Another patent focuses on a method for examining an object using an X-ray recording system for phase contrast imaging with stochastic phase scanning. This method also involves moving components relative to one another during the X-ray image recording. The total exposure time is composed of partial exposure times, and the intensity in each pixel is determined for each partial image. The image information is then derived from the partial images and displacements.

Career Highlights

Jens Rieger is currently employed at Siemens Aktiengesellschaft, where he continues to develop innovative solutions in the field of imaging technology. His work has contributed to advancements in how objects are examined using X-ray systems, enhancing the accuracy and efficiency of imaging processes.

Collaborations

Rieger collaborates with talented coworkers, including Gisela Anton and Jürgen Durst, who contribute to the innovative environment at Siemens. Their combined expertise fosters a culture of creativity and technological advancement.

Conclusion

Jens Rieger is a prominent figure in the realm of X-ray imaging technology, with a focus on developing methods that improve the examination of objects. His contributions through patents and collaboration with skilled professionals highlight his commitment to innovation in this critical field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…