This inventor holds 1 USPTO granted patent and 2 published patent applications. Top assignee: University of California. Active years: 2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2026
Title: Junxiang Zhao and High-Resolution Illumination Nanoscopy
Introduction
Junxiang Zhao is an inventor based in San Diego, California, and is associated with the University of California. His patent work addresses optical materials and techniques for illuminating specimens at resolutions beyond the diffraction limit.
Latest Patents
The supplied information lists one patent for Zhao: “High Effective Refractive Index Materials for Ultra-High Resolution Illumination Nanoscopy.” The invention describes a structure made from one or more high effective refractive index materials on a substrate. When it receives light, the structure can generate sub-diffraction-limit illumination patterns, including speckle patterns, to illuminate a specimen while images are captured. The materials may have an effective refractive index of 3 or greater, with examples including hyperbolic metamaterial multilayers, nanowire-based hyperbolic metamaterials, and organic hyperbolic materials. Zhao is credited with 1 patent in the information provided.
Career Highlights
Zhao’s listed patent reflects work at the intersection of materials science and advanced microscopy. By using high-index materials to create fine illumination patterns, the disclosed approach aims to support ultra-high-resolution imaging.
Collaborations
The supplied information identifies Zhaowei Liu and Yeon Ui Lee as Zhao’s coworkers. Their names are associated with his professional context, though specific roles in the patent are not provided.
Conclusion
Junxiang Zhao’s listed invention explores how high effective refractive index materials can enable sub-diffraction-limit illumination for nanoscopy, highlighting a focused contribution to advanced optical imaging.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
