The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 14, 2026

Filed:

Feb. 04, 2022
Applicant:

The Regents of the University of California, Oakland, CA (US);

Inventors:

Zhaowei Liu, San Diego, CA (US);

Yeon Ui Lee, San Diego, CA (US);

Qian MA, San Diego, CA (US);

Junxiang Zhao, San Diego, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/06 (2006.01); G02B 1/00 (2006.01); G02B 21/36 (2006.01);
U.S. Cl.
CPC ...
G02B 21/06 (2013.01); G02B 1/002 (2013.01); G02B 21/365 (2013.01);
Abstract

A high effective refractive index structure may include one or more high effective refractive index materials disposed on a substrate. The high effective refractive index structure configured to respond to a light received at the high effective refractive index structure by at least generating one or more sub-diffraction limit illumination patterns for illuminating a specimen while one or more frames are captured of the illuminated specimen. The one or more sub-diffraction limit illumination patterns may include one or more speckle patterns. The one or more high effective refractive index materials may exhibit an effective refractive index equal to or greater than 3. Examples of high effective refractive index materials include hyperbolic metamaterial (HMM) multilayers, nanowire based hyperbolic metamaterials, and organic hyperbolic materials (OHM).


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