This inventor holds 1 USPTO granted patent. Top assignee: Peking University. Active years: 2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2026
Title: Junjie Pan - Innovator in Material Analysis
Introduction
Junjie Pan is a prominent inventor based in Shenzhen, China. He has made significant contributions to the field of material analysis through his innovative methods and systems. His work focuses on utilizing crystal structure databases to enhance material analysis processes.
Latest Patents
Junjie Pan holds a patent for a "Crystal structure database-based material analysis method and system, and application." This patent discloses a material analysis method that compares experimental pattern information obtained from the examination of a to-be-tested sample with theoretical pattern information calculated from material structure data in the crystal structure database. The method allows for the intelligent analysis of crystallographic information and phase composition of the sample, including space group, unit cell parameters, and specific coordinates of atoms in the unit cell. This innovative approach enables large-scale high-throughput and high-precision material analysis, laying the groundwork for a data mining and analysis platform for material patterns.
Career Highlights
Junjie Pan is affiliated with Peking University, where he continues to advance his research and development in material analysis. His work has garnered attention for its potential applications in various scientific and industrial fields.
Collaborations
Junjie Pan collaborates with notable colleagues, including Feng Pan and Shunning Li, who contribute to his research endeavors and enhance the impact of his innovations.
Conclusion
Junjie Pan's contributions to material analysis through his patented methods demonstrate his commitment to advancing scientific knowledge and technology. His work not only enhances the understanding of material properties but also paves the way for future innovations in the field.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
