Nishishirakawa, Japan

Junichi Uchida

This inventor holds 1 USPTO granted patent. Top assignee: Shin-Etsu Handotai Co., Ltd.. Active years: 2012.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Junichi Uchida. Retrieved from https://idiyas.com/inventor/junichi-uchida-lphuxqr2

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2012

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1 patent (USPTO):Explore Patents

Title: Junichi Uchida: Innovator in Band Saw Cutting Technology

Introduction

Junichi Uchida is a notable inventor based in Nishishirakawa, Japan. He has made significant contributions to the field of cutting technology, particularly with his innovative band saw cutting apparatus. His work has implications for improving productivity and quality in manufacturing processes.

Latest Patents

Uchida holds a patent for a band saw cutting apparatus and ingot cutting method. This invention features a cutting table designed for horizontal placement of an ingot, an endless-belt blade that operates in a tensioned state between pulleys, and a coolant spraying opening to enhance the cutting process. The apparatus allows for stable quality during cutting, extends the blade's lifetime, and boosts overall productivity.

Career Highlights

Junichi Uchida is associated with Shin-Etsu Handotai Co., Ltd., where he has applied his expertise in cutting technology. His innovative approach has led to advancements in the efficiency and effectiveness of cutting methods used in various industries.

Collaborations

Uchida has worked alongside notable colleagues such as Hidehiko Nishino and Yoshihiro Hirano. Their collaborative efforts have contributed to the development of cutting-edge technologies in the field.

Conclusion

Junichi Uchida's contributions to band saw cutting technology exemplify the impact of innovation in manufacturing. His patent reflects a commitment to enhancing productivity and quality in industrial processes.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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